EMC Tests

Epec 3610 control units are certified according to EMC tests that are described in this section.

 

The following tables provide a summary of performed EMC tests:

 

Emission tests according to the test specification EN 61000-6-3 (2007), Amd. A1 (2011)

Emission test

Test method

Radiated disturbance

EN 55016-2-3

Conducted disturbance at the mains ports

EN 55016-2-1

 

Immunity tests according to the test specification EN 61000-6-2 (2005)

Immunity test

Test method

Electrostatic discharge (ESD)

EN 61000-4-2

Radiated radio-frequency electromagnetic field

EN 61000-4-3

Electrical fast transients (EFT/B)

EN 61000-4-4

Surges

EN 61000-4-5

Conducted radio-frequency field immunity

EN 61000-4-6

 

 

Emission tests according to the E/ECE Regulation No. 10, Revision 4

Emission test

Test method

Measurement of radiated interference field strength

in the frequency range 30 – 1000 MHz

E/ECE Reg. No. 10,

Annexes 7 and 8

Measurement of conducted disturbances

E/ECE Reg. No. 10,

Annex 10

 

Immunity tests according to the E/ECE Regulation No. 10, Revision 4

Immunity test

Test method

Radiated radio-frequency electromagnetic field

E/ECE Reg. No. 10,

Annex 9

Immunity to transient disturbances conducted along

supply lines

E/ECE Reg. No. 10,

Annex 10

 

 

 

 The following tables provide more detailed descriptions about the performed EMC tests:

 

Emission tests according to the E/ECE Regulation No. 10, Revision 4

Radiated disturbance emission test

  • Test method E/ECE Reg. No. 10, Annexes 7 and 8, CISPR 25

 

Frequency (MHz)

Limit value (dBmV/m)

30 – 1000

62/52/63

(Broadband QP)

30 – 1000

52/42/53

(Narrowband AVE)

 

Conducted disturbances emission test

  • Test method E/ECE Reg. No. 10, Annex 10, ISO 7637-2: 2004/Amd.1:2008

 

Port

Limit level (V)

12 V DC input

+75

-100

24 V DC input

+150

- 450

 

Immunity tests according to the E/ECE Regulation No. 10, Revision 4 (2012)

Immunity to transient disturbances conducted along supply lines test

 

  • Test method E/ECE Reg. No. 10, Annex 10, ISO 7637-2: 2004/Amd.1:2008

  • Performance criterion:

Pulse

Criterion

1

C

2a

A

2b

C

3a

A

3b

A

4

C (12 V)

A (24 V)

5a

C

 

  • 12 V input, Pulse:

Pulse

Pulse parameters

1

 -150 V, Ri 10 Ω, 3 s, 5000 pulses

2a

+112 V, Ri 2 Ω, 200 ms, 5000 pulses

2b

+10 V, 500 ms, 10 pulses

3a

-220 V, 10/90 ms, 60min

3b

+150 V, 10/90 ms, 60min

4

td 40 ms -7,0 V, 20 s -6 V, 10 pulses

5a

td 400ms, Ri 0,5 Ω, +70 V, 1 pulses

td 100ms, Ri 10 Ω, +123 V, 1 pulses

 

  • 24 V input, Pulse:

Pulse

Pulse parameters

1

 -600 V, Ri 50 Ω, 3 s, 5000 pulses

2a

+112 V, Ri 2 Ω, 200 ms, 5000 pulses

2b

+20 V, 500 ms, 10 pulses

3a

-300 V, 10/90 ms, 60min

3b

+300 V, 10/90 ms, 60min

4

td 100 ms -12 V, 10 s -5 V, 1 pulses

5a

td 350ms, Ri 1 Ω, +70 V, 1 pulses

td 100ms, Ri 10 Ω, +123 V, 1 pulses

 

 

Immunity of ESAs to electromagnetic radiation

 

  • Test method E/ECE Reg. No. 10, Annex 9, ISO 11452-2:2004, ISO 11452-4:2005, Cor 1: 2009

  • Performance criterion: A

 

Specification

Step

Dwell time

Frequency Range (MHz)

Test level

Modulation

AM80% 1 kHz

5%

3 s

20-80

60 mA

Modulation

AM80% 1 kHz

2%

3 s

80-800

30 V/m

PM

577/4600 μs

1%

3 s

800-2000

30 V/m (constant peak)

 

Classification of functional status

  

Class A:

All functions of a device/system perform as designed during and after exposure to disturbance.

 

Class B:

All functions of a device/system perform as designed during and after exposure to disturbance. However, one or more of them can go beyond specified tolerance. All functions return automatically to within normal limits after exposure is removed. Memory functions shall remain class A.

 

Class C:

One or more functions of a device/system do not perform as designed during exposure but return automatically to normal operation after exposure is removed.

 

Class D:

One or more functions of a device/system do not perform as designed during exposure and do not return to normal operation until exposure is removed and a device/system is reset by simple “operator/use” action.

 

Class E:

One or more functions of a device/system do not perform as designed during exposure and cannot be returned to operation without repairing the device/system.

 

 


EN 61000-6-3 (2007), Amd. A1 (2011)
Electromagnetic compatibility-generic emission standard

part6-3: residential, commercial and light industry

Radiated disturbance emission test

 

  • Test method EN 55016-2-3

 

Frequency (MHz)

Limit value (dBmV/m)

30 – 1000

30/37 (QP)
 

Conducted disturbance at main ports emission test

  • Test method EN 55016-2-1

 

Frequency (MHz)

Limit value (dBmV)

0,15 - 30

66/56/60 (QP)

0,15 - 30

56/46/50 (AVE)

 

EN 61000-6-2 (2005)
Electromagnetic compatibility-generic immunity standard
part6-2: industrial environment

Conducted radio-frequency common mode immunity test

  • Test method EN 61000-4-6

  • Performance criterion A

 

Specification

Port

Test level

Frequency range 0,150-80 MHz, Modulation

AM80% 1 kHz,

 Dwell time 3 s

DC input port

10 VRMS

Signal ports

10 VRMS
 

Radiated radio-frequency electromagnetic field immunity test

  • Test method EN 61000-4-3

  • Performance criterion A

 

Specification

Range (MHz)

Test level

 Modulation

AM 80% 1 kHz,

 Dwell time 1 s

80-1000

10 V/m

1400-2700

3 V/m
 

Electrical fast transient (EFT/B) immunity test

  • Test method EN 61000-4-4

  • Performance criterion B

 

Test pulse

Port

Test level

Repetition frequency 5 kHz, Duration 1 minute

DC input port

± 2,0 kV

Signal ports

± 1,0 kV
 

Surge Immunity

  • Test method EN 61000-4-5

  • Performance criterion B

Specification

Port

Path

Test level

Pulses: 5

Repetition rate: 60 s

DC Input port

Line to Line

± 0,5 kV

Line to Ground

± 0,5 kV

± 1,0 kV
 

Electrostatic discharge (ESD) immunity test

  • Test method EN61000-4-2

  • Performance criterion B

 

Discharge mode

Test level (kVp)

Contact

± 2, ± 4, ± 6, ± 8

Indirect contact

± 2, ± 4,  ± 8

Air

± 2, ± 4, ± 8, ± 15

 

 

Performance criteria for immunity tests

 

Performance criterion A:

The EUT shall continue to operate as intended during and after the test. No degradation of performance is allowed.

 

Performance criterion B:

The EUT shall continue to operate as intended after the test. However, moderate degradation of performance is allowed. No change of actual operating state or loss of memory functions is allowed.